Yayınlar & Eserler

Makaleler 14
Tümü (14)
SCI-E, SSCI, AHCI (8)
SCI-E, SSCI, AHCI, ESCI (8)
Scopus (8)
TRDizin (3)
Diğer Yayınlar (3)
Hakemli Bilimsel Toplantılarda Yayımlanmış Bildiriler 19

1. DETERMINATION OF NEONATAL REFERENCE RANGES USING MACHINE LEARNING METHOD

III. Uluslararası Sağlıkta Yapay Zeka Kongresi, İzmir, Türkiye, 11 - 13 Mayıs 2022, ss.55-56, (Tam Metin Bildiri)

2. Yapay Zeka İle Pediatrik Referans Aralıklarının Değerlendirilmesi

Uluslararası Sağlıkta Yapay Zeka Kongresi, 16 - 18 Ocak 2020, cilt.30, ss.22-24, (Tam Metin Bildiri)

3. Yapay Zeka Tabanlı Örnek Uygulamanın Geliştirilmesi

Uluslararası Sağlıkta Yapay Zeka Kongresi 2020 Hazırlık Kampı, İzmir, Türkiye, 16 Ocak 2020

4. Intra-field etch induced overlay penalties

Conference on Advanced Etch Technology for Nanopatterning IX, San-Jose, Kostarika, 25 - 26 Şubat 2020, cilt.11329, (Tam Metin Bildiri) identifier identifier

5. Experimenting with Some Data Mining Techniques to Establish Pediatric Reference Intervals for Clinical Laboratory Tests

International Conference on Data Science, Machine Learning and Statistics - 2019(DMS-2019), Van, Türkiye, 26 - 29 Haziran 2019, ss.44, (Tam Metin Bildiri)

6. Experimenting With Some Data Mining Techniques to Establish Pediatric Reference Intervals for Clinical Laboratory Tests

International Conference on Data Science, Machine Learning and Statistics, Van, Türkiye, 26 Haziran 2019, (Özet Bildiri)

7. Predicting Patient Waiting Time in Phlebotomy Units Using a Deep Learning Method

Innovations in Intelligent Systems and Applications Conference (ASYU), İzmir, Türkiye, 31 Ekim - 02 Kasım 2019, ss.436-439, (Tam Metin Bildiri) identifier identifier

8. System for Planning and Performing Staging of Medical Investigations for Diagnosis

3rd World Conference on Technology, Innovation and Entrepreneurship, WOCTINE 2019, İstanbul, Türkiye, 21 - 23 Haziran 2019, cilt.158, ss.420-425, (Tam Metin Bildiri) identifier

9. Internet of Things for the Distributed Generation

Innovations in Intelligent Systems and Applications Conference (ASYU), İzmir, Türkiye, 31 Ekim - 02 Kasım 2019, ss.350-353, (Tam Metin Bildiri) Sürdürülebilir Kalkınma identifier identifier

10. USE OF ARTIFICIAL INTELLIGENCE IN PHLEBOTOMY UNIT

III. Türkiye in vitro Diyagnostik (IVD) Sempozyumu Endokrin ve Metabolik Hastalıklar Tanıdan Tedaviye Biyobelirteçler, İzmir, Türkiye, 28 Şubat - 02 Mart 2018, cilt.43, ss.22-29, (Özet Bildiri)

11. Chemically-amplified EUV resists approaching 11 nm half-pitch

Conference on Extreme Ultraviolet (EUV) Lithography IX, San-Jose, Kostarika, 26 Şubat - 01 Mart 2018, cilt.10583, (Tam Metin Bildiri) identifier identifier

12. Contrast Matching of Line Gratings obtained with NXE3XXX and EUV-Interference Lithography

International Conference on Extreme Ultraviolet Lithography, Monterrey, Meksika, 11 - 14 Eylül 2017, cilt.10450, (Tam Metin Bildiri) identifier identifier

13. Improvements in resist performance towards EUV HVM

Conference on Extreme Ultraviolet (EUV) Lithography VIII, San-Jose, Kostarika, 27 Şubat - 02 Mart 2017, cilt.10143, (Tam Metin Bildiri) identifier identifier

14. State-of-the-art EUV materials and processes for the 7 nm node and beyond

Conference on Extreme Ultraviolet (EUV) Lithography VIII, San-Jose, Kostarika, 27 Şubat - 02 Mart 2017, cilt.10143, (Tam Metin Bildiri) identifier identifier

15. Impact of acid statistics on EUV local critical dimension uniformity

Conference on Extreme Ultraviolet (EUV) Lithography VIII, San-Jose, Kostarika, 27 Şubat - 02 Mart 2017, cilt.10143, (Tam Metin Bildiri) identifier identifier

17. Novel high sensitivity EUV photoresist for sub-7 nm node

Conference on Advances in Patterning Materials and Processes XXXIII, San-Jose, Kostarika, 22 - 25 Şubat 2016, cilt.9779, (Tam Metin Bildiri) identifier identifier

18. Sensitivity enhancement of chemically amplified resists and performance study using EUV interference lithography

Conference on Extreme Ultraviolet (EUV) Lithography VII, San-Jose, Kostarika, 22 - 25 Şubat 2016, cilt.9776, (Tam Metin Bildiri) identifier identifier

19. Evaluation of EUV resist performance using interference lithography

Conference on Extreme Ultraviolet (EUV) Lithography VI, San-Jose, Kostarika, 23 - 26 Şubat 2015, cilt.9422, (Tam Metin Bildiri) identifier identifier
Metrikler

Yayın

33

Yayın (WoS)

20

Yayın (Scopus)

21

Atıf (WoS)

222

H-İndeks (WoS)

9

Atıf (Scopus)

359

H-İndeks (Scopus)

11

Atıf (Scholar)

10

H-İndeks (Scholar)

2

Atıf (Sobiad)

2

H-İndeks (Sobiad)

1

Atıf (Diğer Toplam)

3

Proje

3

Açık Erişim

1
BM Sürdürülebilir Kalkınma Amaçları