In order to investigate the optimal conditions for highly orientated and epitaxial buffer layers on textured Ni tapes, we have deposited perovskite textured La2Zr2O7 (LZO) films on Ni tapes using a reel-to-reel sol-gel process for fabrication of second generation high-T-c superconductors. Of these usual parameters, precursor types, solvents, chelating agents, and annealing conditions were chosen to prepare LZO solutions. This effect on epitaxial growth of LZO of these processing and texturing parameters was evaluated using X-ray diffraction (XRD), environment scanning electron microscopy (ESEM), energy dispersive spectrometry (EDS) and orientation imaging microscope (OIM), atomic force microscope (AFM) and X-ray pole figure analysis. Based on the following results, we have found textured, homogenous, dense, crack free and pinhole free, LZO films with a strong c-axis orientation on textured Ni tapes by post-annealing at 1150degreesC for 10 min under 4% H-2-Ar gas flow. (C) 2003 Elsevier B.V. All rights reserved.