Adjusted power Divergence test statistics for Simple Goodness of Fit under Clustered Sampling
Int. Conf. On Advances in Prob. and Stat.-Theory and Applications: A Celebration pf N. Balakrishnan’s 30 years of Contributiıons to Statistics, Hong Kong, 28 - 31 Aralık 2011
- Yayın Türü: Bildiri
- Basıldığı Ülke: Hong Kong
- Dokuz Eylül Üniversitesi Adresli: Evet