Research Information System
MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, vol.96, no.3, pp.300-306, 2002 (SCI-Expanded)
In this study, texturing influence of process parameters in sol-gel Tb2O3 buffer layers on textured Ni tapes was evaluated. A solution deposition process was used to grow epitaxial Tb2O3 buffer layers on the Ni tapes for YBa2Cu3O7-x (YBCO) coated conductors. The Tb2O3 precursor solution was prepared using solvent, chelating agents and modifying chemical liquid materials. The solution was dip-coated onto the textured Ni substrates by a reel-to-reel sol-gel process. The amorphous thin films were dried at 300 degreesC for 30 s and then heat-treated at 500 degreesC for 2 min in air in the reel-to-reel sol-gel set up with a 3-zones furnace. The calcined films were annealed at temperature range of 750 and 1170 degreesC for 10-30 min under three different atmospheres. X-ray diffraction of the buffer layers indicated a strong c-axis orientation on the Ni tape substrate. The textured buffer layers were produced onto the textured Ni tapes at 1150 degreesC for 10 min under 4% H-2-Ar gas flow thereby using modifying triethanol amin. Environment scanning electron microscopy images of the Tb2O3 buffer layer showed crack-free, pinhole-free, dense and smooth microstructure. (C) 2002 Elsevier Science B.V. All rights reserved.