Characterization of the Different Thickness of ZnO Thin Films Deposited on Glass Substrate by PLD

TOPRAK A., YİĞİT GEZGİN S., KEPCEOĞLU A., KILIÇ H. Ş.

International Congress on Semiconductor Materials Devices, ICSMD 2017, Konya, Turkey, 17 - 19 August 2017, (Summary Text)

• Publication Type: Conference Paper / Summary Text
• City: Konya
• Country: Turkey
• Dokuz Eylül University Affiliated: Yes