Özcan, M. And ŞENOL, Y. 2023. Using Deep Learning Architectures in Detecting Fabric Defects. EGE 10th International Conference On Applied Sciences , (İzmir, Turkey), 2818-2827.

Özcan, M., & ŞENOL, Y., (2023). Using Deep Learning Architectures in Detecting Fabric Defects . EGE 10th International Conference On Applied Sciences (pp.2818-2827). İzmir, Turkey

Özcan, Muhammet, And YAVUZ ŞENOL. "Using Deep Learning Architectures in Detecting Fabric Defects," EGE 10th International Conference On Applied Sciences, İzmir, Turkey, 2023

Özcan, Muhammet And ŞENOL, YAVUZ. "Using Deep Learning Architectures in Detecting Fabric Defects." EGE 10th International Conference On Applied Sciences , İzmir, Turkey, pp.2818-2827, 2023

Özcan, M. And ŞENOL, Y. (2023) . "Using Deep Learning Architectures in Detecting Fabric Defects." EGE 10th International Conference On Applied Sciences , İzmir, Turkey, pp.2818-2827.

@conferencepaper{conferencepaper, author={Muhammet Özcan And author={YAVUZ ŞENOL}, title={Using Deep Learning Architectures in Detecting Fabric Defects}, congress name={EGE 10th International Conference On Applied Sciences}, city={İzmir}, country={Turkey}, year={2023}, pages={2818-2827} }